#Arrhenius equation calculator verification

The last thing any manufacturer wants is for customers to find the flaws in their products. To be sure, real time testing is also done as a final verification, but by the time those results are in, the batteries have long since left the manufacturing plant and are in the hands of customers. The only way to test such an extreme shelf-life and to verify this claim is through accelerated test methods. Anything that has a multi-year shelf-life or life cycle.Īlkaline batteries, for example, are often advertized to have a 10-year shelf-life.

0.992 is the correct one.The Arrhenius Theory of Accelerated TestingĪccelerated testing is crucial in the development and quality control of many devices including batteries, integrated circuits, microprocessors, etc. Please, enter numbers with a dot, not a comma.

That's what you do while testing unique, expensive equipment. In my first Highly accelerated life testing using Arrhenius equation online calculator I assumed that r, limit number of failures when we stop the test would be 1. R = limit number of failures when we stop the test Īccording to quantile table of chi distribution for α = 0,9 and ν = 6, we have X2 = 7,78. Ν (nu), degrees of freedom (DF), determines the shape of the X2 curve reliability calculations use ν = 2r + 2 Α (alpha), confidence level (CL) or probability, is the applicable percent area under the X2 probability distribution curve We take α = 0,9 X2 (Chi-squared) is the probability estimation for the number of failures or rejects Λ = failure rate = 1E-8 = 0,00000001 for example or 1/MTBF or 1/MTTF ĭ = number of tested devices - we take 1 Īf = acceleration factor derived from the Arrhenius equation – we've just found it! We have equation for accelerated test time: T test = test temperature = 200 ☌ or 473 K for example. T use = use temperature = 50 ☌ or 323 K for example K (Boltzmann’s constant) = 8.617 x 10-5 eV/K This equation calculates the time acceleration value that results from operating a device at an elevated temperature.Įa = activation energy (eV) of the failure mode = 0,8 eV for example The climatic chamber that might be used for the accelerated life tests of the electronic device can support temperatures up to 200 ☌, while nominal operational temperature for the electronic device is 50 ☌.Īssuming datasheet says the activation energy for the failure mode of aging failure that violates the safety goal is 0.8 electron volts, please estimate how much accelerated test time will it take to define if the failure rate assigned to the failure mode is valid.įirst, we have to calculate Acceleration Factor (Af). An electronic device under the test has the failure rate of 10E-8 1/h related to the failure mode of aging failure that violates some safety goal.

#Arrhenius equation calculator verification

ISO 26262-5 strongly recommends accelerated life testing for the ASIL-D rated hardware components during the verification stage. This method is most commonly used when testing electronic devices.īut how do we know how long we need to perform temperature tests to confirm an MTBF of 10,000 hours? My online calculator for highly accelerated life testing will do it quickly and easily. One way to conduct such tests is to use an increased test temperature. Highly accelerated life testing is a way to save time on testing new devices.